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Solutions Enterprise Test Solutions Arendar Multimedia Test System Industry Solutions Semiconductor Communications Aerospace / Defense Biomedical / Biotech Automotive Process Manufacturing Communications Literature & Demo Software Brochures Brochures Descriptions of VI Technology products and services. Automated Test Solutions This 4-page brochure provides an overview of VI Technology's products and services for automated test systems, measurement, real-time control and enterprise test data management. The brochure also includes customer quotations and application examples that describe how VI Technology helps companies reduce their product development costs and time to market. Arendar Enterprise Test Software This 6-page brochure gives an overview of the capabilities of Arendar Enterprise Test Software. The brochure includes how Arendar manages test data, the technologies in Arendar, desktop and enterprise configurations, scalability, automatic code generation, and descriptions of the suite of Arendar software applications. Customer Application Solutions Customer Application Solutions Examples of real applications that VI Technology developed and describes the tools and techniques we used in these applications.   Enterprise TDM Solution Increases IC Characterization Efficiency This solution describes how a large semiconductor manufacturer and also a leading OEM supplier of hard disk drive preamplifier and motor controller solution was able to leverage an enterprise test data management solution developed by VI Technology to increase the efficiency of their integrated circuit testing and characterization process. VI Technology Implements Advanced Printing Test System for PARC® PARC (Palo Alto Research Center, Inc., a Xerox subsidiary), a research and development pioneer in the field of advanced laser printing technologies, needed a solution for testing and analyzing the performance of a next-generation industrial printing system. This solution describes how the test system implemented by VI Technology provides PARC with the flexibility to use the print head test system both as a research and development tool and also as a platform for demonstrating their advanced industrial printing system capabilities to prospective customers. Flexible Microwave and RF Power Transistor Test and Data Management System This solution describes an automated functional test system for microwave and RF power transistors. The functional test system tests a variety of transistor types using different test plans and different test stations. All test data is stored in a centralized database. Stress Test Characterization System for High Precision Military Oscillators This solution describes an automated functional test system to characterize high precision oscillators over extreme temperature conditions. The system integrates RF instrumentation, DAQ boards, multiplexers, temperature chambers, and Microsoft VisualBasic to automate the tests and produces pass/fail and characterization reports for engineering and manufacturing. PC-Based Testing of G.SHDSL Chipsets This solution describes an automated functional test system for DSL chipsets. The functional test system determines the performance, robustness and reliability of hardware and embedded software, analyzes failure modes, and performs tests under different scenarios to give feedback to the engineering design group.   PC Based Testing of POTS Cards This solution describes an automated functional test system for Plain Old Telephone System (POTS) Cards. While simulating the telephone lines, the functional test system performs parametric tests, measures voltage, current, resistance, and audio bandwidth response. Application Notes and White Papers Application Notes and White Papers In-depth technical papers that explain the techniques to develop test systems as well as measurement and automation systems. Characterization of PLL Clock Generators This application note describes how to make clock jitter measurements, divider check, and lock time measurements on the phase/frequency detector, low-pass filter, voltage controlled oscillator, and base clock divider circuits of a phased lock loop (PLL). Characterization of Mixed Signal ICs This application note covers the hardware and software considerations of characterizing mixed signal ICs used in communication systems. The application note covers device stimuli, device response, timing and synchronization, test sequencing, instrumentation programming, IC programming, data management, and data analysis & presentation. The app note also gives a detailed example using these design techniques on how to characterize an analog to digital converter IC. Purchasing Versus Developing a Test Data Management Solution This white paper describes the benefits of using an off-the-shelf test data management solution versus developing a proprietary system yourself. Characterization of Voice CODECs This application note describes how to characterize voice CODECs including tests for idle channel noise, total distortion, frequency response, input level, gain tracking, and differential offset. Managing Test Data This application note covers the need for managing test data, advantages of using databases in test systems, an introduction to databases, designing a test database, relational databases available today, interfacing to databases, and connecting test software to databases. Demonstration Software and Tools Demonstration Software and Tools Interactive software applications and tools, available for download, on CD, or via online Webcast that show VI Technology's services and products.       Free Arendar Test Data Management On-Demand Webcast Demonstration This On-Demand Webcast presentation and demonstration shows the capabilities of the Arendar Enterprise Test Data Management Software. The on-demand Webcast shows you how Arendar organizes test data and gives you visibility of your product and process functionality throughout the product life cycle by providing real-time access, analysis, and reporting. Click here to get a copy of the Arendar Webcast presentation.

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