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NI Automated Test Summit 2007

Date:	May 8, 2007 9:00am - 6:00pm CDT
Location:	Online

This fourth annual event hosted by National Instruments moves online this year so you can conveniently access the latest technical information on automated test system design. Throughout this full-day event, you can watch keynote presentations, attend numerous technical sessions, and interact with live representatives from VI Technology and other top test companies through a virtual exhibition.

Technical session topics include:

Cost-effective strategies for test system design

Design insights for creating reusable test systems

Lessons learned in test systems optimization

Techniques for maintaining system accuracy and availability

Tips for integrating disparate instrumentation platforms

Visit the VI Technology exhibit online to learn how Arendar, our award winning enterprise test software, gives you instant Web access to your design, characterization, and validation test results and reports, anytime and anywhere, proving the information you need to optimize your product performance and quality. You can download free enterprise test technical information or chat with our experts online during the event.

Click here and register today!

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